Design and Analysis of Accelerated Tests for Mission Critical Reliability

Design and Analysis of Accelerated Tests for Mission Critical Reliability

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Product Description

Design and Analysis of Accelerated Tests for Mission Critical Reliability

  • Used Book in Good Condition

Technical Specifications

Country
USA
Brand
Chapman and Hall/CRC
Manufacturer
Chapman and Hall/CRC
Binding
Hardcover
IsAdultProduct
Height
9.44620110756
Length
6.37620724756
Weight
1.04940036712
Width
0.75
ReleaseDate
2004-04-27T00:00:01Z
NumberOfItems
1
Author
LuValle, Michael J., LeFevre, Bruce G., Kannan, SirRaman