Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
Product ID: 0792390253
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Product Description
Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
- Used Book in Good Condition
Technical Specifications
Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Hardcover
PartNumber
Refer to Sapnet.
Height
9.75
Length
6.5
Weight
0.95019234922
Width
0.5
ReleaseDate
1989-06-30T00:00:01Z
NumberOfItems
1
Author
Kwang-Ting (Tim) Cheng, Agrawal, Vishwani D.
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