Books > Engineering & Transportation > Engineering > Materials & Material Science > Materials Science
Thin Film Analysis by X-Ray Scattering
Product ID: 3527310525
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Product Description
Thin Film Analysis by X-Ray Scattering
Technical Specifications
Country
USA
Brand
Wiley
Manufacturer
Wiley-VCH
Binding
Hardcover
PartNumber
Illustrations
Model
Illustrations
IsAdultProduct
Height
9.547225
Length
6.96849
Weight
1.68874092692
Width
1.1811
NumberOfItems
1
Author
Birkholz, Mario



