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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
Product ID: 1439829411
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Product Description
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)
- Used Book in Good Condition
Technical Specifications
Country
USA
Brand
CRC Press
Manufacturer
CRC Press
Binding
Hardcover
Height
9.75
Length
6.5
Weight
1.3007273458
Width
0.75
NumberOfItems
1
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