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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)
Product ID: 1606507273
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Product Description
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)
Technical Specifications
Country
USA
Brand
Momentum Press
Manufacturer
Momentum Press
Binding
Paperback
PartNumber
Refer to Sapnet.
IsAdultProduct
Height
9
Length
6
Weight
0.50044933474
Width
0.44
ReleaseDate
2015-12-15T00:00:01Z
NumberOfItems
1
Author
Tompkins, Harland G., Hilfiker, James N.
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