Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Product ID: 0792381076 Condition: New

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Product Description

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Hardcover
PartNumber
Refer to Sapnet.
Height
9.79
Length
6.11
Weight
1.6203976257
Width
1.17
ReleaseDate
1998-01-31T00:00:01Z
NumberOfItems
1