Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

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Product Description

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Technical Specifications

Country
USA
Brand
Wiley
Manufacturer
Wiley-IEEE Press
Binding
Hardcover
IsAdultProduct
Height
9.551162
Length
6.448806
Weight
0.4739938633
Width
1.350391
NumberOfItems
1
Author
Strong, Alvin W., Wu, Ernest Y., Vollertsen, Rolf-Peter, Sune, Jordi, La Rosa, Giuseppe, Sullivan, Timothy D., Rauch III, Stewart E.