Pattern Recognition and Machine Learning: Proceedings of the Japan―U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18–20, 1970

Pattern Recognition and Machine Learning: Proceedings of the Japan―U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18–20, 1970

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Product Description

Pattern Recognition and Machine Learning: Proceedings of the Japan―U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18–20, 1970

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Paperback
PartNumber
biography
IsAdultProduct
Height
9.99998
Length
7.00998598
Weight
1.36025215654
Width
0.81
ReleaseDate
2012-12-12T00:00:01Z
NumberOfItems
1