Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis (Integrated Series in Information Systems, 20)

Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis (Integrated Series in Information Systems, 20)

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Product Description

Mapping Nanotechnology Innovations and Knowledge: Global and Longitudinal Patent and Literature Analysis (Integrated Series in Information Systems, 20)

This book defines the application of Information Technology’s systematic and automated knowledge mapping methodology to collect, analyze and report nanotechnology research on a global basis. The result of these analyses is be a systematic presentation of the state of the art of nanotechnology, which will include basic analysis, content analysis, and citation network analysis of comprehensive nanotechnology findings across technology domains, inventors, institutions, and countries.

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Hardcover
PartNumber
Refer to Sapnet.
Height
9.6
Length
6.1
Weight
1.54984970186
Width
0.8
ReleaseDate
2008-12-04T00:00:01Z
NumberOfItems
1
Author
Chen, Hsinchun