MEETOOT 100PCS P75-D2 Large Head Spring Loaded Contact Pin Circuit Board Testing Probe Suitable for Testing Flexible and Thin/High Density Circuit Board

MEETOOT 100PCS P75-D2 Large Head Spring Loaded Contact Pin Circuit Board Testing Probe Suitable for Testing Flexible and Thin/High Density Circuit Board

• Large round tip design, protects pads: The probe features a large round tip (D-type) structure with a smooth, rounded contact surface, ensuring that precision pads, gold fingers or flexible printed circuits (FPCs) are not scratched or damaged during testing. It is particularly suitable for functional testing (FCT) of high-value PCB.
• Standard dimensions, high compatibility: The probe has a diameter of 1.3 mm, a total length of 16.5 mm and a shank diameter of 1.02 mm, making it compatible with standard P75 series probe holders and 1.4 mm drill holes. It can be directly substituted for probe holders in the same series, facilitating maintenance without the need to change fixtures.
• 100g low spring force, gentle and non-damaging: With a spring force of approximately 100g, this low-force design ensures stable contact without causing mechanical damage to fragile test points, making it particularly suitable for testing flexible, thin or high-density circuit boards.
• Stable conductivity, reliable performance: Rated current 3A, contact resistance less than or equal to 50 milliohms. Gold-plated tubing with gold-plated tips, offering resistance to oxidation and corrosion, ensuring low electrical resistance throughout long-term use.
• Pack of 100, meeting the testing needs of small to medium batches: Each pack contains 100 pieces, suitable for research and development and debugging, small-batch production, repair and testing, or fixture spare parts. Universal model, readily available on the market, with low long-term maintenance costs.