Impact of Dynamic Voltage Scaling on Nano-Scale Circuit Optimization: 45-nm CMOS Technology
Product ID: 3846584541
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Product Description
Impact of Dynamic Voltage Scaling on Nano-Scale Circuit Optimization: 45-nm CMOS Technology
Technical Specifications
Country
USA
Brand
LAP Lambert Academic Publishing
Manufacturer
LAP LAMBERT Academic Publishing
IsAdultProduct
Height
8.66
Length
5.91
Weight
0.24912235606
Width
0.16
NumberOfItems
1
Author
Esquit, Carlos, Hu, Jiang







