Impact of Dynamic Voltage Scaling on Nano-Scale Circuit Optimization: 45-nm CMOS Technology

Impact of Dynamic Voltage Scaling on Nano-Scale Circuit Optimization: 45-nm CMOS Technology

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Product Description

Impact of Dynamic Voltage Scaling on Nano-Scale Circuit Optimization: 45-nm CMOS Technology

Technical Specifications

Country
USA
Brand
LAP Lambert Academic Publishing
Manufacturer
LAP LAMBERT Academic Publishing
IsAdultProduct
Height
8.66
Length
5.91
Weight
0.24912235606
Width
0.16
NumberOfItems
1
Author
Esquit, Carlos, Hu, Jiang