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Atom Probe Microscopy (Springer Series in Materials Science, 160)

Atom Probe Microscopy (Springer Series in Materials Science, 160)

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Product Description

Atom Probe Microscopy (Springer Series in Materials Science, 160)

This uniquely powerful microscopy technique has seen major innovations in the last decade, including pulsed-laser-assisted evaporation. As the most practical, up-to-date critical review of the field, this volume includes examples of APM from materials science.

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Paperback
PartNumber
24 black & white tables, 3 colour tables
IsAdultProduct
Height
9.2499815
Length
6.0999878
Weight
1.00089866948
Width
0.95
ReleaseDate
2014-06-11T00:00:01Z
NumberOfItems
1
Author
Gault, Baptiste, Moody, Michael P., Cairney, Julie M., Ringer, Simon P.

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